AFM facilitates atomic resolution imaging of insulator and conductor surfaces. One of the techniques utilizing AFM is frequency-modulation AFM (FM-AFM), which has been used for the atomic-resolution ...

Optical characterisation of thin films is a critical field that bridges fundamental research and application in materials science and engineering. It encompasses the use of various spectroscopic ...

Germany’s Fraunhofer Center for Silicon Photovoltaics (Fraunhofer CSP) is developing a range of high-resolution material and thin film microscopic and nanoscopic characterization methods to use in ...

The introduction of several new dielectric materials for high-speed ultra-large-scale integration (ULSI) microelectronics has increased the necessity for metrology tools to measure the ...

(A) a single magnetic domain and (B) multiple magnetic domains with opposite polarization. (C) Following the subtraction of image (A) from image (B), a Kerr image with sharp contrast is obtained [39].

Functional polymer thin films possess many technological applications ranging from optoelectronics to sensors. Their flexibility, tunable properties, and low-cost preparation make them very appealing ...

Thin films form the basis of many industries today, including semiconductors, electric vehicles, smart optical coatings, sophisticated medical equipment, and protective layers on high-temperature ...

Dendritic structures that emerge during the growth of thin films are a major obstacle in large-area fabrication, a key step towards commercialization. However, current methods of studying dendrites ...

insights from industryDr. Max Junda & Dr. Lyle GordonSenior Member of the Technical Staff and Director of MaterialsCovalent Metrology In this interview, AZoMaterials speaks with Dr. Max Junda, Senior ...

Diagram of an X-ray Reflectometry (XRR) setup: This schematic shows the arrangement of the X-ray tube, Gӧbel mirror, sample holder, and detector. The X-rays are emitted from the tube, shaped by slits ...